W.M. Keck Center for Surface and Interface Imaging (KECK) Instrumentation
Scanning Probe Microscopes (SPM)
Optical Microscopes
Electron Microscope
Scanning Probe Microscopes (SPM)
Digital Instruments Dimension 3100 SPM : This instrument can image 100 μm x 100 μm area of a surface with a vertical range of ~ 6 μm, and stable imaging areas ranging from 1 μm x 1 μm to its maximum scan area. The Dimension is equipped with a closed-loop scanner which uses active optical feedback to keep the probe tip from deviating due to thermal fluctuations. In addition, it has an acoustic and thermally isolatin on an air-pneumatic vibration isolation tag shroud/housing and is operatedble. It can handle samples as large as 6" diameter on its 6" stainless steel vacuum platen and can mount larger samples depending on shape. Standard modes of operation include Contact mode and Tapping mode Atomic Force Microscopy (AFM), Tunneling Atomic Force Microscopy (TUNA), and Scanning Tunneling Microscopy (STM).
Digital Instruments Multimode SPM with a Nanoscope III controller: The Multimode is the highest resolution, commercially available scanning probe microscope. It is designed for atomic-scale resolution imaging of material surfaces. Two piezoelectric scanners are available for use with the Multimode; the J scanner is capable of measuring areas up to 120 μm x 120 μm with a vertical range of ~ 5 μm, and the E scanner is capable of imaging areas up to 10 μm x 10 μm with a vertical range of ~ 2.5 μm. Sample size is limited to ~ 1 cm x 1 cm mounted on 10 mm or 12 mm magnetic steel platens. This instrument is on a vibration isolation table and is able to operate in Contact mode and Tapping mode AFM and STM.
Agilent 5500 AFM: The universal microscope base of the Agilent 5500 AFM permits easy integration with an environmental chamber or an inverted optical microscope for complimentary optical detection of samples. The unique sample plate, which can accept samples of up to ~ 1” x 1,” and top down scanning configuration is especially advantageous for imaging in fluids. The Agilent 5500 is equipped with a closed-loop scanner for high-precision control scanner position and able to image areas up to 100 μm x 100 μm. A second smaller piezoelectric scanner with a maximum imaging area of 10 μm x 10 μm is also available. This instrument is located on a vibration isolation table and capable of operating in Contact mode, Tapping mode, and Magnetic AC Mode AFM and current sensing. Additionally, a Nikon Ti-S inverted microscope with a broadband source and 5 M pixel color CCD is available to couple with the Agilent AFM for integrated optical and AFM measurements.
Optical Microscopes
Confocal Fluorescence Microscope: The Nikon C1si scanning confocal microscope is equipped with 4 excitation laser sources including 7 excitation wavelengths (408, 457, 477, 488, 514, 561, and 638 nm), Epi-fluorescence, and a spectral detection system with wavelength resolution. The C1si is equipped with a perfect focus motorized nosepiece to maintain long-term focus and a CFI Plan APO VC 60x Oil immersion objective (NA=1.4).
Total Internal Reflection Fluorescence (TIRF) Microscope: The Nikon Ti-E TIRF imaging microscope is equipped with 4 excitation sources including 6 excitation wavelength (408, 457, 477, 488, 514, and 561 nm), Epi-fluorescence, an imaging CCD detector (Andor DU 897), and a spectral detection system (Princeton Instruments). The Ti-E is equipped with a perfect focus motorized nosepiece for maintaining long term focus, a CFI APO 60x Oil TIRF objective (NA=1.49), and a CFI APO 100x Oil TIRF objective (NA = 1.49). This microscope is capable of detecting single molecule fluorescence. Electron Microscope
Scanning Electron Microscope(SEM): The FEI Inspec-S SEM is equipped with a standard imaging back scattered electron detector, an energy dispersive X-ray spectroscopy (EDS) system, and a JC Nabity Nanometer Pattern Generation System to do electron beam patterning and lithography. The SEM is capable of patterning 30 nm or less line widths. The EDS system, Thermo Noran 6, provides chemical elemental composition of samples.
