W.M. Keck Center for Surface and Interface Imaging (KECK)
This year the Keck Center for Nano-scale Structure and Dynamics is taking delivery of new instrumentation provided by a grant from the Keck Foundation. These new capabilities will be managed by Dr. Brooke Beam, who joined the Chemistry Research Support staff in April to oversee the operation of the facility.
In addition to the Atomic Force/Probe Microscopes (AFM) already present in the facility, which includes a Veeco Dimension 3100 AFM, a Veeco MultiMode III AFM, and a new Agilent 5500 AFM (also purchased with the Keck Foundation grant), there will be two new optical microscopes available. The new instruments from Nikon are a C1 Si Laser Scanning Confocal Fluorescence microscope and a Total Internal Reflection Fluorescence (TIRF) microscope. Both of these microscopes will allow researchers to study fluorescent molecules or fluorophore labeled samples using multi-wavelength laser excitation.
To round out the capabilities in the Keck Center, a new FEI Inspec S Scanning Electron Microscope has been ordered. The SEM is a Tungsten filament system with a minimum resolution of 3 nm and 30 keV beam energy. Additional capabilities added to the SEM are a JC Nabity Nanometer Pattern Generation System (NPGS) for electron beam lithography of features less than 1 micron and an Energy Dispersive Spectrometer system for chemical element mapping of surfaces.
For sample submission, instrument training, and experimental design contact:
1306 E. University Blvd
Tucson, AZ 85721
Fax: (520) 621-8407